ZrSnO₂S is an experimental mixed-metal oxide-sulfide semiconductor combining zirconium, tin, oxygen, and sulfur elements. This quaternary compound belongs to the emerging class of anion-mixed semiconductors being investigated for photocatalytic and optoelectronic applications where bandgap engineering and defect chemistry offer tunable electronic properties. Research interest centers on photocatalysis (pollutant degradation, water splitting) and potential thin-film device applications, though it remains primarily a laboratory-scale material without established commercial production or widespread industrial deployment.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 0.2000 | eV | DFT · GLLB-SC | ||
Magnetic Moment(μB) | 1.371 | μB | DFT |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | 1.400 | eV/atom | DFT |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data