ZnO — Properties & Data | MatWorld

ZnO

semiconductor

· ZnO

Zinc oxide (ZnO) is a versatile inorganic semiconductor compound with a wide bandgap, available in both bulk and thin-film forms for functional applications. It is widely used in optoelectronics (LEDs, photodetectors), transparent conductive coatings, varistors for surge protection, and as a functional filler in rubber and ceramics; engineers select ZnO when combining electrical/optical functionality with thermal stability and low-cost manufacturability is critical. Its hexagonal wurtzite crystal structure and moderate mechanical stiffness make it suitable for piezoelectric applications and structural ceramics, while its transparency to visible light and tunable conductivity (through doping) enable its use in displays and energy harvesting devices.

LED and optoelectronic devicesTransparent conductive coatingsVaristors and surge protectionPiezoelectric sensors and actuatorsRubber and elastomer reinforcementPhotocatalytic coatings

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

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Method

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)3 entries	18,802.8	ksi	DFT
↳	19,918	ksi	DFT · OptB88vdW
↳	18,802.8	ksi	DFT · PBE
Elastic Compliance Tensor(Sij)	Matrix (redacted)	1/GPa	DFT · PBE
Elastic Anisotropy(AU)	0.1324	-	DFT · PBE
Elastic Stiffness Tensor(Cij)	Matrix (redacted)	ksi	DFT · PBE
Poisson's Ratio(ν)2 entries	0.3600	-	DFT · OptB88vdW
↳	0.3565	-	DFT · PBE
Shear Modulus(G)3 entries	5,969.5	ksi	DFT
↳	5,998.8	ksi	DFT · OptB88vdW
↳	5,969.5	ksi	DFT · PBE

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)2 entries	4.237	BTU/(hr·ft·°F)	Measured
↳	37.27	BTU/(hr·ft·°F)	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Density(ρ)	0.1995	lb/in³	DFT · OptB88vdW

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Method

Carrier

Property	Value	Unit	Conditions	Source
Band Gap(Eg)3 entries	3.440	eV	Measured
↳	0.9650	eV	DFT · OptB88vdW
↳	2.473	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)3 entries	11.43	-	DFT · OptB88vdW
↳	11.35	-	DFT · PBE
↳	9.459 range 6.812–12.11median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	5.157	-	DFT · OptB88vdW
↳	3.145	-	DFT · TBmBJ
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	DFT · PBE
Total Dielectric Tensor(ε)	Matrix (redacted)	-	DFT · PBE
Electron Effective Mass(m*e)	0.2200	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	2.340	me	DFT · OptB88vdW · 27°C
Electrical Conductivity(σ)	11.79	S/cm	Measured · 427°C
Electrical Resistivity(ρe)	0.000848	Ω·m	Measured · 427°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)2 entries	0.7875	C/m²	DFT · OptB88vdW
↳	0.3787	C/m²	DFT · PBE
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	DFT · PBE
Thermoelectric Power Factor(PF)3 entries	0.0000301	W/(m·K²)	Measured · 427°C
↳	0.000424	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00157	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)3 entries	-159.9	μV/K	Measured · 427°C
↳	-65.14	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	352.1	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	13.17	%	DFT · TBmBJ
Thermoelectric Figure of Merit(zT)	0.000	-	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)2 entries	-1.592	eV/atom	DFT · OptB88vdW
↳	-1.816	eV/atom	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.