TlN — Properties & Data | MatWorld

TlN

Name: TlN
Brand: MatWorld

semiconductor

· TlN

Thallium nitride (TlN) is a compound semiconductor material belonging to the III-V nitride family, characterized by a rock-salt crystal structure. While primarily of research and academic interest, TlN has been investigated for potential applications in high-pressure devices, optoelectronic systems, and specialized semiconductor contexts where its unique electronic and mechanical properties may offer advantages over more common alternatives like GaN or AlN.

High-pressure semiconductor devicesResearch optoelectronicsSpecialized coatingsExperimental superconductor applicationsMaterials science research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	93.00	GPa	DFT · OptB88vdW
Poisson's Ratio(ν)	0.3400	-	DFT · OptB88vdW
Shear Modulus(G)	38.10	GPa	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	9.981	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)3 entries	0.000	eV	DFT · OptB88vdW
↳	0.000	eV	DFT · TBmBJ
↳	1.400	eV	Measured
Dielectric Constant (Relative Permittivity)(εr)	41.58	-	DFT · OptB88vdW
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	1.349	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.000329	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000736	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-71.11	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	113.1	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	5.840	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.8828	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	0.8750	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

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RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

TlN

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Physical Properties

Electrical Properties

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