SnO
semiconductor· SnO
SnO is a tin monoxide semiconductor with a layered crystal structure that exhibits moderate elastic stiffness and relatively low density. It is primarily investigated in research contexts for thin-film electronics, gas sensing, and transparent conductive oxide applications, where its tunable bandgap and native p-type conductivity offer advantages over more conventional semiconductors like SnO₂. Engineers consider SnO when designing low-cost, solution-processable devices or when the chemical and optical properties of tin oxide are advantageous—though commercial maturity remains limited compared to established semiconductor alternatives.
transparent thin-film transistorsgas sensorssolar cells and photovoltaicslow-cost flexible electronicsoptoelectronic research deviceslithium-ion battery anodes
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 32.39 | GPa | — | ||
| ↳ | 32.29 | GPa | — | ||
| ↳ | 47.82 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 7.265 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Exfoliation Energy(Eexf) | 100.7 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.2290 | - | — | ||
| ↳ | 0.2500 | - | — | ||
Shear Modulus(G)3 entries | 21.39 | GPa | — | ||
| ↳ | 20.22 | GPa | — | ||
| ↳ | 32.25 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.090 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.000 | eV | — | ||
| ↳ | 0.5070 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 18.73 | - | — | ||
| ↳ | 22.02 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.5931 | C/m² | — | ||
| ↳ | 0.000 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -131.3 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.01080 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -1.455 | eV/atom | — | ||
| ↳ | -1.429 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.