SiS2
ceramic· SiS2
Silicon disulfide (SiS₂) is a layered ceramic compound composed of silicon and sulfur atoms arranged in a two-dimensional crystalline structure. This material is primarily of research interest rather than established in mainstream industrial applications, with potential use in nanoelectronics, optoelectronics, and energy storage devices where its layered geometry enables mechanical exfoliation into thin films. Engineers considering SiS₂ are typically exploring it as a wide-bandgap semiconductor, thermal insulator, or component in next-generation device architectures where its anisotropic properties and van der Waals bonding between layers may offer advantages over conventional ceramics.
experimental semiconductors2D nanomaterials researchthermal barriersoptoelectronic devicesnanocomposites
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 3,548.8 | ksi | — | ||
| ↳ | 4,889.2 | ksi | — | ||
Exfoliation Energy(Eexf) | 85.99 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2200 | - | — | ||
Shear Modulus(G)2 entries | 2,794.6 | ksi | — | ||
| ↳ | 3,789.8 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.08382 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 3.086 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 4.020 | - | — | ||
| ↳ | 8.580 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.02040 | C/m² | — | ||
| ↳ | 0.4853 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -202.7 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.7372 | eV/atom | — | ||
| ↳ | -0.6803 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.