ReSe2
semiconductor· ReSe2
ReSe₂ is a layered transition metal dichalcogenide (TMD) semiconductor composed of rhenium and selenium atoms arranged in a stacked structure. This material is primarily of research interest for next-generation electronics and optoelectronics, where its layer-dependent properties enable applications in 2D device engineering, field-effect transistors, and photodetectors as an alternative to more established TMDs like MoS₂. The relatively weak interlayer bonding makes it amenable to mechanical exfoliation into ultrathin films, positioning it as a candidate material for flexible electronics and van der Waals heterostructure engineering.
2D semiconductor devicesResearch photodetectorsFlexible electronicsField-effect transistorsVan der Waals heterostructuresNanoelectronics prototyping
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 9,442 | ksi | — | ||
Exfoliation Energy(Eexf) | 75.10 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2500 | - | — | ||
Shear Modulus(G) | 6,201.8 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.3190 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 1.150 | eV | — | ||
| ↳ | 1.069 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 12.11 | - | — | ||
| ↳ | 32.96 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -345.1 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.3798 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.