PbS
semiconductor· PbS
Lead sulfide (PbS) is a narrow-bandgap semiconductor compound with a rock-salt crystal structure, valued for its sensitivity to infrared radiation. It is primarily used in infrared detectors and thermal imaging systems where its ability to respond to heat signatures is essential, as well as in photovoltaic and optoelectronic devices. Engineers select PbS over wider-bandgap alternatives when infrared detection in the mid-wave to long-wave region is required, and it remains important in niche applications despite health and environmental concerns associated with lead-based materials.
infrared detectorsthermal imaging sensorsphotovoltaic cellsoptoelectronic devicesmilitary/aerospace sensingmedical thermal diagnostics
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Property OverviewNormalized to typical max values
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 7,535.7 | ksi | — | ||
| ↳ | 5,338.8 | ksi | — | ||
Compressive Strength(σc) | 1.362 | ksi | — | ||
Elongation at Break(εf) | 190.5 | - | — | ||
Exfoliation Energy(Eexf) | 187.6 | meV/atom | — | ||
Flexural Strength (MOR)(σf) | 4.980 | ksi | — | ||
Hardness (Vickers)(HV) | 115.8 | HV | — | ||
Poisson's Ratio(ν) | 0.2700 | - | — | ||
Shear Modulus(G)2 entries | 4,263.5 | ksi | — | ||
| ↳ | 2,986.3 | ksi | — | ||
Ultimate Tensile Strength(σUTS) | 5.046 | ksi | — | ||
Young's Modulus(E) | 79.43 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Glass Transition Temperature(Tg) | -22.04 | °F | — | ||
Melting Point / Solidus(Tm) | 236.6 | °F | — | ||
Maximum Service Temperature(Tmax) | 681.6 | °F | — | ||
Thermal Conductivity(k) | 0.3626 | BTU/(hr·ft·°F) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2608 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 0.4100 | eV | — | ||
| ↳ | 0.8951 | eV | — | ||
| ↳ | 0.5780 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 68.37 | - | — | ||
| ↳ | 75.89 range 17.20–134.6median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 4.344 | C/m² | — | ||
| ↳ | 0.5237 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -240.3 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.07980 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.5094 | eV/atom | — | ||
| ↳ | -0.5762 | eV/atom | — | ||
Refractive Index(n) | 1.642 | - | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.