NbSe2

semiconductor
· NbSe2

NbSe₂ is a layered transition metal dichalcogenide (TMD) semiconductor composed of niobium and selenium, belonging to the family of two-dimensional materials that can be mechanically exfoliated into atomically thin sheets. It is primarily a research and development material studied for next-generation electronic and optoelectronic devices, including flexible transistors, photodetectors, and integrated circuits where its layer-dependent bandgap and high charge carrier mobility offer advantages over conventional silicon at nanoscale dimensions. Engineers consider NbSe₂ when designing ultra-thin devices, energy storage systems, or catalytic applications where the material's weak van der Waals interlayer bonding enables integration into heterogeneous device stacks.

2D semiconductor devicesflexible and wearable electronicsphotodetectors and optoelectronicsfield-effect transistorsenergy storage (batteries/supercapacitors)catalytic applications

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
22.26
GPa—
↳
49.92
GPa—
Exfoliation Energy(Eexf)
98.27
meV/atom—
Poisson's Ratio(ν)
0.1400
-—
Shear Modulus(G)2 entries
13.38
GPa—
↳
27.69
GPa—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
6.074
kg/m³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
1.400
eV—
↳
0.000
eV—
Dielectric Constant (Relative Permittivity)(εr)
129.8
-—
Magnetic Moment(μB)
0.000
µB—
Piezoelectric Modulus(eij)
0.000
C/m²—
Seebeck Coefficient(S)
21.97
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.01460
eV/atom—
Formation Energy(ΔHf)
-0.8528
eV/atom—
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.