MgTe

semiconductor

· MgTe

Magnesium telluride (MgTe) is a II-VI semiconductor compound combining a lightweight alkaline earth metal with a chalcogen element, forming a cubic crystal structure with moderate band gap characteristics. It is primarily investigated in research and specialized optoelectronic applications, particularly for infrared detection, photovoltaic devices, and high-energy radiation sensing where its wide bandgap and stable crystal structure offer advantages over more common semiconductors. As an emerging material rather than an established industrial standard, MgTe appeals to developers of next-generation sensors and space-qualified electronics seeking alternatives to traditional III-V or II-VI compounds (such as CdTe or GaAs) in niche performance windows.

infrared detectors and sensorsradiation detection systemsphotovoltaic researchhigh-temperature optoelectronicsspace and aerospace sensorsthin-film device research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)2 entries	4,734.8	ksi	—
↳	5,318.5	ksi	—
Poisson's Ratio(ν)	0.3400	-	—
Shear Modulus(G)2 entries	1,782.2	ksi	—
↳	2,016	ksi	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	8.494	BTU/(hr·ft·°F)	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.1349	lb/in³	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Band Gap(Eg)2 entries	3.600	eV	—
↳	2.495	eV	—
Dielectric Constant (Relative Permittivity)(εr)3 entries	7.980	-	—
↳	7.856	-	—
↳	16.17 range 9.136–23.21median of 2 measurements	-	—
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	—
Total Dielectric Tensor(ε)	Matrix (redacted)	-	—
Magnetic Moment(μB)	0.000	µB	—
Piezoelectric Modulus(eij)2 entries	0.08940	C/m²	—
↳	0.4098	C/m²	—
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	—
Seebeck Coefficient(S)	-73.22	µV/K	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	—
Formation Energy(ΔHf)2 entries	-1.084	eV/atom	—
↳	-0.9519	eV/atom	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.

Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.