InPS4
semiconductor· InPS4
InPS₄ is an indium phosphorus sulfide compound belonging to the family of III-V and mixed anion semiconductors. This material is primarily of research interest for optoelectronic and photovoltaic applications, where its direct bandgap and layered crystal structure offer potential advantages in light emission, detection, and energy conversion devices. InPS₄ represents an emerging alternative to more conventional semiconductors, with potential relevance in next-generation solar cells, photodetectors, and integrated photonics where tunable electronic properties and lattice engineering are valuable.
Photovoltaic devicesPhotodetectorsOptoelectronics researchIntegrated photonicsTwo-dimensional materials applicationsSemiconductor research and development
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 25.60 | GPa | — | ||
Poisson's Ratio(ν) | 0.2700 | - | — | ||
Shear Modulus(G) | 15.50 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 3.099 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.120 | eV | — | ||
| ↳ | 2.329 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 11.40 | - | — | ||
| ↳ | 7.819 range 6.011–9.627median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.06830 | C/m² | — | ||
| ↳ | 0.5078 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -176.9 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4039 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.