HfS3
semiconductorHfS3 is a layered transition metal trichalcogenide semiconductor composed of hafnium and sulfur, belonging to the family of two-dimensional materials that can be mechanically exfoliated into thin sheets. This compound is primarily of research interest for next-generation electronics and optoelectronics, where its tunable bandgap and layered structure make it a candidate for flexible devices, photodetectors, and field-effect transistors that could complement or replace conventional silicon in specialized applications. HfS3 remains largely in the experimental phase, but represents a promising direction in van der Waals materials engineering for scaled-down electronic systems where conventional bulk semiconductors reach performance or miniaturization limits.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 18.62 | GPa | — | ||
| ↳ | 48.41 | GPa | — | ||
Exfoliation Energy(Eexf) | 55.69 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2500 | - | — | ||
Shear Modulus(G)2 entries | 12.04 | GPa | — | ||
| ↳ | 30.93 | GPa | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.523 | kg/m³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 2.850 | eV | — | ||
| ↳ | 1.183 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 9.600 | - | — | ||
| ↳ | 16.32 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -196.5 | µV/K | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -1.324 | eV/atom | — |