HfHgO3 — Properties & Data | MatWorld

HfHgO3

semiconductor

· HfHgO3

HfHgO3 is an experimental ternary oxide semiconductor combining hafnium and mercury oxides, representing a rare composition in the perovskite-related oxide family. This material remains primarily in research phase, with potential applications in advanced optoelectronic and high-permittivity dielectric devices where the combined properties of hafnium and mercury oxides might enable novel functionality. Its high density and rigid elastic structure suggest interest in specialized microelectronics or radiation-detection applications, though industrial adoption is limited and material synthesis and phase stability require further development.

research semiconductor compoundshigh-permittivity dielectricsoptoelectronic devicesradiation detection (exploratory)advanced microelectronics (experimental)

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	166.2	GPa	DFT · OptB88vdW
Poisson's Ratio(ν)	0.3500	-	DFT · OptB88vdW
Shear Modulus(G)	61.86	GPa	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	10.19	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)4 entries	0.000	eV	DFT · OptB88vdW
↳	0.000	eV	DFT · TBmBJ
↳	1.593	eV	DFT · PBE
↳	0.000	eV	DFT · GLLB-SC
Magnetic Moment(μB)3 entries	0.000	μB	DFT
↳	-0.5848	μB	DFT
↳	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.0000201	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00000602	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-4.620	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	-2.530	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions
Energy Above Hull(ΔEhull)	0.2968	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)3 entries	-2.228	eV/atom	DFT
↳	1.640	eV/atom	DFT
↳	-2.087	eV/atom	DFT · OptB88vdW

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

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RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

HfHgO3

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

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