GeTe
ceramic· GeTe
GeTe is a binary compound semiconductor and phase-change material that belongs to the chalcogenide family, combining germanium and tellurium elements. It is primarily investigated for thermal energy storage, nonvolatile memory applications (such as phase-change RAM), and infrared optics, where its ability to switch between crystalline and amorphous states is exploited. GeTe is notable for its reversible structural transition and strong optical contrast between phases, making it attractive as an alternative to more common phase-change materials in next-generation data storage and advanced thermal management systems.
Phase-change memory devicesThermal energy storage systemsInfrared optics and windowsNonvolatile memory applicationsResearch-stage semiconductor devices
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 29.57 | GPa | — | ||
| ↳ | 31.00 | GPa | — | ||
| ↳ | 36.89 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 2.496 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Exfoliation Energy(Eexf) | 543.5 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.1777 | - | — | ||
| ↳ | 0.2200 | - | — | ||
Shear Modulus(G)3 entries | 24.28 | GPa | — | ||
| ↳ | 23.94 | GPa | — | ||
| ↳ | 27.43 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.926 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 0.6440 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 93.99 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 2.135 | C/m² | — | ||
| ↳ | 0.9662 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -258.3 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.01610 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.2513 | eV/atom | — | ||
| ↳ | -0.09429 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.