Gallium Nitride (GaN) is a wide-bandgap semiconductor compound composed of gallium and nitrogen, belonging to the III-V nitride family of materials. It is the dominant material for high-brightness blue and ultraviolet LEDs, RF power amplifiers, and next-generation power electronics converters, where its wide bandgap enables high operating temperatures, high switching frequencies, and superior energy efficiency compared to silicon-based alternatives. Engineers select GaN for applications demanding high power density, fast switching performance, and thermal stability in compact form factors.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Young's Modulus(E) | 26,251.8 | ksi | — |
1 interactive curve for this material
Stress-strain, S-N fatigue and environmental knockdown curves are free with an account.
Create free account| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Melting Point / Solidus(Tm) | 4,531.4 | °F | — | ||
Specific Heat Capacity(Cp) | 0.1170 | BTU/(lb·°F) | — | ||
Thermal Conductivity(k)2 entries | 104.6 | BTU/(hr·ft·°F) | Measured | ||
| ↳ | 75.11 | BTU/(hr·ft·°F) | — | ||
Thermal Conductivity vs Temperature(k(T)) | Curve (28 pts) | BTU/(hr·ft·°F) | Measured · bulk crystal (ammonothermal) | ||
Coefficient of Thermal Expansion(α (CTE)) | 3.106 | µin/in·°F | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2222 | lb/in³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 3.250 | eV | Measured | ||
| ↳ | 1.943 | eV | DFT · OptB88vdW | ||
| ↳ | 3.084 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr) | 8.900 | - | — | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 5.880 | - | DFT · OptB88vdW | ||
| ↳ | 4.516 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.1900 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 1.647 | me | DFT · OptB88vdW · 27°C | ||
Thermoelectric Power Factor(PF)2 entries | 0.000390 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00184 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -59.89 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 320.9 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 3.710 | % | DFT · TBmBJ |
2 interactive curves for this material
Stress-strain, S-N fatigue and environmental knockdown curves are free with an account.
Create free account| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Refractive Index vs Wavelength(n(λ))2 entries | Curve (101 pts) | - | Measured · ordinary ray · 27°C | ||
| ↳ | Curve (101 pts) | - | Measured · extraordinary ray · 27°C |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | -0.5680 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data