Ga2HgSe4
semiconductor· Ga2HgSe4
Ga₂HgSe₄ is a quaternary semiconductor compound belonging to the family of mercury-containing chalcogenides, combining gallium, mercury, and selenium in a structured lattice. This material is primarily of research interest for infrared optics and nonlinear optical applications, where its wide bandgap and optical transparency in the infrared region make it a candidate for specialized photonic devices. While not yet widely deployed in mainstream industrial production, compounds in this material family are explored for potential use in tunable laser systems, frequency conversion, and thermal imaging components where conventional semiconductors reach their performance limits.
infrared opticsnonlinear optical devicesresearch photonicsfrequency conversionthermal imaging componentsexperimental semiconductors
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 31.55 | GPa | — | ||
| ↳ | 36.94 | GPa | — | ||
Poisson's Ratio(ν) | 0.2800 | - | — | ||
Shear Modulus(G)2 entries | 18.27 | GPa | — | ||
| ↳ | 21.11 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.904 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 1.950 | eV | — | ||
| ↳ | 0.8720 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 14.14 | - | — | ||
| ↳ | 15.92 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.07749 | C/m² | — | ||
| ↳ | 0.6477 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -52.94 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4445 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.