FeAsS — Properties & Data | MatWorld

FeAsS

Name: FeAsS
Brand: MatWorld

semiconductor

· FeAsS

FeAsS is an iron arsenide sulfide compound belonging to the semiconductor family, combining iron with arsenic and sulfur elements. This material is of significant research interest in the context of iron-based superconductors and optoelectronic devices, where layered iron pnictide/chalcogenide structures show potential for high-performance applications. While not yet widely deployed in mainstream industrial production, FeAsS and related iron-based compounds represent an alternative platform to traditional semiconductors for specialized applications requiring unusual electronic or magnetic properties.

superconductor researchoptoelectronic devicesexperimental photovoltaicsmagnetic materials developmentsemiconductor device researchmaterials characterization studies

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)	142.7	GPa	DFT
Shear Modulus(G)	116.9	GPa	DFT

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	6.168	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)2 entries	0.6580	eV	DFT · OptB88vdW
↳	0.4000	eV	Measured
High-Frequency Dielectric Constant (ε∞)(ε∞)	26.12	-	DFT · OptB88vdW
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00142	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00131	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-414.2	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	420.7	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.5119	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

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RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

FeAsS

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

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