CoAsS
semiconductor· CoAsS
CoAsS is a ternary semiconductor compound composed of cobalt, arsenic, and sulfur, belonging to the family of metal chalcogenide semiconductors. This material is primarily of research and developmental interest for next-generation optoelectronic and photovoltaic applications, where its tunable bandgap and potential for efficient charge carrier transport make it an alternative to conventional binary semiconductors. CoAsS systems are being investigated for thin-film solar cells, photodetectors, and light-emitting devices, offering potential advantages in cost, abundance, or performance over established III-V or II-VI semiconductors, though industrial deployment remains limited.
thin-film photovoltaicsphotodetectorsoptoelectronic deviceslight-emitting applicationssemiconductor researchnext-generation solar cells
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 20,153.7 | ksi | — | ||
| ↳ | 18,956.4 | ksi | — | ||
Poisson's Ratio(ν) | 0.2500 | - | — | ||
Shear Modulus(G)2 entries | 15,145.2 | ksi | — | ||
| ↳ | 11,713.2 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2203 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 0.6000 | eV | — | ||
| ↳ | 0.000 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 29.84 | - | — | ||
| ↳ | 27.30 range 23.57–31.02median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.07114 | C/m² | — | ||
| ↳ | 0.02578 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -36.43 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000400 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4919 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.