CdTe

semiconductor
· CdTe

Cadmium telluride (CdTe) is a II-VI compound semiconductor with a zinc-blende crystal structure, widely recognized as a direct-bandgap material suitable for optoelectronic and photovoltaic applications. It is a primary material for thin-film solar cells and X-ray/gamma-ray detectors due to its favorable band gap and high atomic number, offering superior light absorption and radiation sensitivity compared to silicon-based alternatives. CdTe's established industrial presence in utility-scale photovoltaic manufacturing and medical imaging systems makes it a proven choice where efficiency, compactness, and radiation detection capability are critical; however, its toxicity and cadmium content impose strict handling and regulatory considerations that engineers must account for in design and deployment.

thin-film photovoltaic cellsX-ray/gamma-ray detectorsnuclear medicine imaginghigh-efficiency solar modulesspace-qualified solar panelsradiation detection sensors

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
Pa
Pa
Pa
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
Pa
Poisson's Ratio(ν)2 entries
-
-
Shear Modulus(G)3 entries
Pa
Pa
Pa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Thermal Conductivity(k)
W/(m·K)
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
eV
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
-
-
median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
µB
Piezoelectric Modulus(eij)2 entries
C/m²
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
eV/atom
Formation Energy(ΔHf)2 entries
eV/atom
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.