BiSBr
semiconductor· BiSBr
BiSBr is a layered bismuth-based semiconductor compound belonging to the family of two-dimensional (2D) materials and van der Waals heterostructures. This is primarily a research material under investigation for next-generation optoelectronic and electronic devices, with potential applications in photovoltaics, photodetectors, and field-effect transistors where its layered crystal structure enables mechanical exfoliation into ultrathin sheets. Engineers and researchers are exploring BiSBr because its anisotropic properties and tunable bandgap characteristics make it attractive for flexible electronics and integrated photonics applications where conventional bulk semiconductors are unsuitable.
2D materials researchPhotodetectors and optoelectronicsFlexible electronics prototypesPhotovoltaic cells (emerging)Field-effect transistors (FETs)Van der Waals heterostructure engineering
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 25.71 | GPa | — | ||
Exfoliation Energy(Eexf) | 111 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.3000 | - | — | ||
Shear Modulus(G) | 12.31 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.376 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 1.920 | eV | — | ||
| ↳ | 1.880 | eV | — | ||
| ↳ | 1.945 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 65.62 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -188.8 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.6117 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.