BiSBr is a layered bismuth-based semiconductor compound belonging to the family of two-dimensional (2D) materials and van der Waals heterostructures. This is primarily a research material under investigation for next-generation optoelectronic and electronic devices, with potential applications in photovoltaics, photodetectors, and field-effect transistors where its layered crystal structure enables mechanical exfoliation into ultrathin sheets. Engineers and researchers are exploring BiSBr because its anisotropic properties and tunable bandgap characteristics make it attractive for flexible electronics and integrated photonics applications where conventional bulk semiconductors are unsuitable.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 3,728.9 | ksi | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 111 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.3000 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 1,785.4 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2303 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)4 entries | 1.945 | eV | DFT · OptB88vdW | ||
| ↳ | 2.667 | eV | DFT · TBmBJ | ||
| ↳ | 1.880 | eV | Measured | ||
| ↳ | 1.920 | eV | Measured | ||
Dielectric Constant (Relative Permittivity)(εr) | 65.62 | - | DFT · OptB88vdW | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 9.569 | - | DFT · OptB88vdW | ||
| ↳ | 7.994 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.6967 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 2.107 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.00174 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00151 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -188.8 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 364.6 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 9.440 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf) | -0.6117 | eV/atom | DFT · OptB88vdW |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data