AgI
semiconductor· AgI
Silver iodide (AgI) is an inorganic semiconductor compound formed from silver and iodine, belonging to the I–VII binary chalcogenide family. It is primarily used in photographic emulsions, cloud seeding applications, and specialized optical coatings, where its light-sensitive and nucleation properties are leveraged. AgI is notable for its role in infrared optics and as a research compound for photovoltaic and photodetector development, though it faces competition from more stable alternatives in modern optoelectronic applications.
photographic emulsionscloud seeding nucleantsinfrared optical coatingsphotodetector researchsolid-state imagingsemiconductor research
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 4,598.8 | ksi | — | ||
| ↳ | 4,413.5 | ksi | — | ||
| ↳ | 3,882.7 range 3,642.7–4,598.8median of 3 measurements | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.02081 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Exfoliation Energy(Eexf) | 88.71 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.3478 | - | — | ||
| ↳ | 0.4300 | - | — | ||
Shear Modulus(G)3 entries | 1,558.1 | ksi | — | ||
| ↳ | 733.9 | ksi | — | ||
| ↳ | 967.8 range 886.6–1,558.1median of 3 measurements | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 1.410 | BTU/(hr·ft·°F) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1995 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.020 | eV | — | ||
| ↳ | 1.260 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 7.160 | - | — | ||
| ↳ | 7.353 | - | — | ||
| ↳ | 7.154 range 5.479–18.11median of 6 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.09146 | C/m² | — | ||
| ↳ | 0.3271 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -59.97 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.00350 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -0.3208 | eV/atom | — | ||
| ↳ | -0.2033 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.