AgI — Properties & Data | MatWorld

AgI

semiconductor

· AgI

Silver iodide (AgI) is an inorganic semiconductor compound formed from silver and iodine, belonging to the I–VII binary chalcogenide family. It is primarily used in photographic emulsions, cloud seeding applications, and specialized optical coatings, where its light-sensitive and nucleation properties are leveraged. AgI is notable for its role in infrared optics and as a research compound for photovoltaic and photodetector development, though it faces competition from more stable alternatives in modern optoelectronic applications.

photographic emulsionscloud seeding nucleantsinfrared optical coatingsphotodetector researchsolid-state imagingsemiconductor research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)3 entries	31.71	GPa	—
↳	30.43	GPa	—
↳	26.77 range 25.12–31.71median of 3 measurements	GPa	—
Elastic Compliance Tensor(Sij)	Matrix (redacted)	1/GPa	—
Elastic Anisotropy(AU)	0.02081	-	—
Elastic Stiffness Tensor(Cij)	Matrix (redacted)	Pa	—
Exfoliation Energy(Eexf)	88.71	meV/atom	—
Poisson's Ratio(ν)2 entries	0.3478	-	—
↳	0.4300	-	—
Shear Modulus(G)3 entries	10.74	GPa	—
↳	5.060	GPa	—
↳	6.673 range 6.113–10.74median of 3 measurements	GPa	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	2.440	W/(m·K)	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	5.522	kg/m³	—

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Band Gap(Eg)2 entries	3.020	eV	—
↳	1.260	eV	—
Dielectric Constant (Relative Permittivity)(εr)3 entries	7.160	-	—
↳	7.353	-	—
↳	7.154 range 5.479–18.11median of 6 measurements	-	—
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	—
Total Dielectric Tensor(ε)	Matrix (redacted)	-	—
Magnetic Moment(μB)	0.000	µB	—
Piezoelectric Modulus(eij)2 entries	0.09146	C/m²	—
↳	0.3271	C/m²	—
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	—
Seebeck Coefficient(S)	-59.97	µV/K	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.00350	eV/atom	—
Formation Energy(ΔHf)2 entries	-0.3208	eV/atom	—
↳	-0.2033	eV/atom	—

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.