ZrSe2

semiconductor
· ZrSe2

ZrSe2 is a layered transition metal dichalcogenide semiconductor composed of zirconium and selenium atoms. It belongs to the broader family of two-dimensional materials that can be mechanically exfoliated into thin layers, making it of significant interest for nanoelectronics and optoelectronics research. While primarily in the research and development phase rather than established industrial production, ZrSe2 is being investigated for applications requiring tunable electronic band gaps, direct bandgap behavior in monolayer form, and compatibility with van der Waals heterostructure engineering—offering potential advantages over more widely studied materials like MoS2 in specific high-performance device architectures.

2D nanomaterials and heterostructuresNext-generation semiconductor devicesOptoelectronic and photovoltaic researchFlexible electronics and wearablesQuantum devices and sensorsMaterials for nanoelectronics prototyping

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
17.51
GPa—
↳
37.57
GPa—
Exfoliation Energy(Eexf)
95.44
meV/atom—
Poisson's Ratio(ν)
0.2200
-—
Shear Modulus(G)2 entries
11.57
GPa—
↳
27.22
GPa—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
5.355
kg/m³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
2.000
eV—
↳
0.3370
eV—
Dielectric Constant (Relative Permittivity)(εr)
58.33
-—
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-—
Total Dielectric Tensor(ε)
Matrix (redacted)
-—
Magnetic Moment(μB)
0.000
µB—
Seebeck Coefficient(S)
-259.7
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.01550
eV/atom—
Formation Energy(ΔHf)
-1.401
eV/atom—
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.