ZrS3
semiconductor· ZrS3
ZrS₃ is a layered transition metal trichalcogenide semiconductor composed of zirconium and sulfur, belonging to the family of two-dimensional (2D) materials with sheet-like crystal structures. This is primarily a research material currently under investigation for next-generation electronic and optoelectronic applications, rather than an established industrial compound. The layered structure and semiconducting properties make it of interest for potential applications in nanoelectronics, photovoltaics, and sensing devices where the ability to exfoliate into thin layers could enable new device architectures.
2D materials researchNanoelectronics and transistorsOptoelectronic devicesLayered semiconductor heterostructuresPhotovoltaic cellsChemical sensors
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 3,216.3 | ksi | — | ||
| ↳ | 6,634 | ksi | — | ||
Exfoliation Energy(Eexf) | 55.49 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.2600 | - | — | ||
Shear Modulus(G)2 entries | 1,603.3 | ksi | — | ||
| ↳ | 4,088.6 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1328 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 2.170 | eV | — | ||
| ↳ | 1.206 | eV | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Seebeck Coefficient(S) | -196.1 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -1.357 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.