Zn0.8Hg0.2Te1
semiconductorZn₀.₈Hg₀.₂Te is a cadmium-free II-VI semiconductor alloy composed of zinc telluride with 20% mercury substitution, belonging to the narrow-bandgap semiconductor family. This material is primarily investigated for infrared (IR) detection and imaging applications, where its narrow bandgap enables sensitivity in the mid-to-long-wavelength IR spectrum; it represents an alternative composition strategy in the HgCdTe family for thermal imaging and spectroscopic sensing without relying on cadmium. While not widely commercialized compared to established IR detector materials, zinc-mercury-tellurium alloys are of research and development interest for cost-reduction and environmental compliance in next-generation thermal cameras, forward-looking infrared (FLIR) systems, and space-borne spectroscopy.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | — | eV | — | — |