YGeO2N is an experimental oxynitride semiconductor compound containing yttrium, germanium, oxygen, and nitrogen. This material belongs to the family of wide-bandgap semiconductors and mixed-anion compounds, which are of interest in advanced semiconductor research for next-generation electronic and photonic devices. YGeO2N remains primarily a research-phase material; its potential applications leverage the tunable electronic properties characteristic of oxynitride systems, particularly where conventional oxides or nitrides alone cannot meet performance requirements.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 1.300 | eV | DFT · GLLB-SC | ||
Magnetic Moment(μB) | -0.000278 | μB | DFT |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf) | 0.5600 | eV/atom | DFT |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data