VCu3Se4
metal· VCu3Se4
VCu₃Se₄ is a ternary intermetallic compound combining vanadium, copper, and selenium, belonging to the class of metal chalcogenides. This is a research-phase material studied primarily for its electronic and structural properties rather than established industrial production. The compound is of interest in materials science for potential applications in thermoelectric devices, semiconducting systems, and solid-state electronics, where the combination of transition metal (vanadium) with copper and chalcogen constituents can yield tunable band structures and transport properties.
thermoelectric devices (research)semiconductor applications (experimental)solid-state electronicshigh-temperature energy conversion (potential)materials physics research
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 5,212.5 | ksi | — | ||
| ↳ | 5,212.5 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.2057 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Poisson's Ratio(ν) | 0.2585 | - | — | ||
Shear Modulus(G)2 entries | 3,000.4 | ksi | — | ||
| ↳ | 3,000.4 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1900 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 0.9750 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 9.000 | - | — | ||
| ↳ | 9.086 | - | — | ||
| ↳ | 9.173 range 8.938–9.408median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.09372 | C/m² | — | ||
| ↳ | 0.08646 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -364 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.4669 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.