TlSe — Properties & Data | MatWorld

TlSe

Name: TlSe
Brand: MatWorld

semiconductor

· TlSe

TlSe is a narrow-bandgap semiconductor compound formed from thallium and selenium, belonging to the III-VI family of binary semiconductors. Historically studied for infrared detection and optoelectronic applications due to its narrow bandgap energy, TlSe remains primarily a research material rather than a mainstream engineering compound; it has seen limited industrial adoption compared to more stable alternatives like HgCdTe or modern quantum dots, partly due to thallium's toxicity and the material's thermodynamic instability at elevated temperatures. Engineers may encounter TlSe in specialized contexts involving infrared sensing, thermal imaging research, or photovoltaic investigations where its unique electronic structure offers theoretical advantages, though material availability, processing challenges, and health/environmental concerns typically favor other semiconductor options for production applications.

infrared detectors (research)thermal imaging sensors (experimental)photovoltaic devices (laboratory)optoelectronic researchbandgap engineering studiesnarrow-gap semiconductor exploration

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	3,924.7	ksi	DFT · OptB88vdW
Poisson's Ratio(ν)	0.2900	-	DFT · OptB88vdW
Shear Modulus(G)	1,904.3	ksi	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.2912	lb/in³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)3 entries	0.5600	eV	Measured
↳	0.2560	eV	DFT · OptB88vdW
↳	0.7440	eV	DFT · TBmBJ
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	14.40	-	DFT · OptB88vdW
↳	10.07	-	DFT · TBmBJ
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00199	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000303	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-136.2	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	63.44	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	25.27	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions
Energy Above Hull(ΔEhull)	0.02450	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)2 entries	-0.2799	eV/atom	DFT · OptB88vdW
↳	-0.3166	eV/atom	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

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RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

TlSe

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