TlN3
semiconductor· TlN3
TlN₃ is an experimental nitride compound containing thallium, belonging to the wider family of metal nitrides being investigated for advanced semiconductor and refractory applications. This material remains primarily in research phase rather than established industrial production, with interest centered on its potential as a wide-bandgap semiconductor or hard coating material. The thallium nitride family is explored for high-temperature electronics, optoelectronics, and wear-resistant applications where conventional semiconductors reach thermal limits, though toxicity concerns and processing challenges have limited commercial deployment compared to more mature alternatives like gallium nitride or titanium nitride.
experimental semiconductor researchhigh-temperature electronicshard coatings and wear resistancerefractory compound developmentwide-bandgap device engineeringmaterials research and characterization
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 27.92 | GPa | — | ||
Poisson's Ratio(ν) | 0.3400 | - | — | ||
Shear Modulus(G) | 10.39 | GPa | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 5.799 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.580 | eV | — | ||
| ↳ | 1.849 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 21.15 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -194.1 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.3211 | eV/atom | — | ||
Formation Energy(ΔHf) | 0.3094 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.