TlInS2
semiconductor· TlInS2
TlInS2 is a ternary semiconductor compound belonging to the thallium-indium chalcogenide family, combining elements from Groups IIIA and VIA of the periodic table. This material is primarily of research interest for optoelectronic and photonic device development, where its layered crystal structure and tunable bandgap make it a candidate for infrared detectors, photovoltaic absorbers, and nonlinear optical applications. Engineers and researchers exploring TlInS2 typically do so in experimental contexts where direct-bandgap semiconductors with anisotropic optical properties or two-dimensional material potential are advantageous over conventional silicon or III-V compounds.
infrared photodetectorsexperimental optoelectronicslayered semiconductor researchnonlinear optical devicesthin-film photovoltaics
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 46.64 | GPa | — | ||
| ↳ | 51.07 | GPa | — | ||
Exfoliation Energy(Eexf) | 113.2 | meV/atom | — | ||
Poisson's Ratio(ν) | 0.3000 | - | — | ||
Shear Modulus(G)2 entries | 22.32 | GPa | — | ||
| ↳ | 24.72 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 6.483 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 2.300 | eV | — | ||
| ↳ | 0.7340 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 45.63 | - | — | ||
| ↳ | 49.72 | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -141.3 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000400 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.6071 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.