Thallium chloride (TlCl) is an ionic semiconductor compound from the thallium halide family, characterized by its direct bandgap and high density. Historically used in infrared optical systems and specialized radiation detection applications, TlCl has seen limited commercial adoption due to toxicity concerns and the availability of superior alternatives like cadmium telluride and mercuric iodide detectors. The material remains of interest in research contexts for high-energy physics instrumentation and niche optoelectronic applications where its specific optical properties provide advantages, though its use is heavily restricted in many jurisdictions.
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| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)2 entries | 2,943.8 | ksi | DFT | ||
| ↳ | 4,119.1 | ksi | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.3200 | - | DFT · OptB88vdW | ||
Shear Modulus(G)2 entries | 920 | ksi | DFT | ||
| ↳ | 1,696.9 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2549 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)3 entries | 3.560 | eV | Measured | ||
| ↳ | 2.208 | eV | DFT · OptB88vdW | ||
| ↳ | 3.114 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 40.82 | - | DFT · OptB88vdW | ||
| ↳ | 29.37 range 5.824–52.91median of 2 measurements | - | DFT · PBEsol | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 5.665 | - | DFT · OptB88vdW | ||
| ↳ | 4.499 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.2600 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 0.5000 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.00180 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00213 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -134.9 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 226.4 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 3.350 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf)2 entries | -1.048 | eV/atom | DFT · OptB88vdW | ||
| ↳ | -1.058 | eV/atom | Measured |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data