TlAs — Properties & Data | MatWorld

TlAs

ceramic

· JVASP-36138· TlAs

TlAs is a III-V semiconductor ceramic compound composed of thallium and arsenic, belonging to the family of binary intermetallic semiconductors. This material is primarily of research and specialized industrial interest due to its semiconducting properties and moderate mechanical stiffness, with applications in narrow-gap infrared detection and specialized optoelectronic devices where its unique band structure offers advantages over more conventional semiconductors like GaAs or InAs. Engineers would consider TlAs when designing infrared sensor systems or thermal imaging components that require operation in specific wavelength ranges, though availability and material handling considerations typically limit it to specialized aerospace and defense applications rather than mainstream commercial use.

infrared detectorsnarrow-gap semiconductorsthermal imaging sensorsoptoelectronic researchaerospace sensing systemsspecialized semiconductor devices

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	5,733.3	ksi	DFT · OptB88vdW
Poisson's Ratio(ν)	0.3200	-	DFT · OptB88vdW
Shear Modulus(G)	2,526.6	ksi	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.2629	lb/in³	DFT · OptB88vdW

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)2 entries	0.000	eV	DFT · OptB88vdW
↳	0.000	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)	57.36	-	DFT · OptB88vdW
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	1.328	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00195	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000259	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-69.59	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	-28.41	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	5.840	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.1753	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	0.1753	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

TlAs

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental