Tl2CdTe4
ceramic· Tl2CdTe4
Tl2CdTe4 is a ternary ceramic compound belonging to the family of telluride semiconductors, combining thallium, cadmium, and tellurium in a structured lattice. This material is primarily investigated in research contexts for optoelectronic and radiation detection applications, where its wide bandgap and heavy-element composition offer potential advantages in infrared sensing and high-energy particle detection. While not yet widely deployed in mainstream industrial production, materials in this telluride family are valued alternatives to more conventional semiconductors when operation at lower temperatures, improved radiation hardness, or extended infrared sensitivity is required.
infrared detectors (research)gamma-ray detectionX-ray sensorssemiconductor researchquantum optoelectronicsspace radiation instrumentation
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 3,567.9 | ksi | — | ||
Poisson's Ratio(ν) | 0.3100 | - | — | ||
Shear Modulus(G) | 1,702.7 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2393 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 0.000 | eV | — | ||
| ↳ | 0.1840 range 0.000–0.3680median of 2 measurements | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 28.85 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.5456 | C/m² | — | ||
Seebeck Coefficient(S) | -128.8 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.1286 | eV/atom | — | ||
Formation Energy(ΔHf) | -0.1378 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.