Titanium dioxide (TiO₂) is a wide-bandgap semiconductor ceramic widely used as a photocatalyst, pigment, and functional coating material. It is the dominant choice for UV-protective and self-cleaning applications due to its strong photocatalytic activity under UV and visible light, excellent chemical stability, and non-toxicity. Engineers select TiO₂ over alternatives when photocatalytic degradation of pollutants, UV absorption, or self-sterilizing surfaces are required; it is also favored in applications demanding high refractive index and whiteness with minimal environmental concern.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 26,125.2 | ksi | — | ||
| ↳ | 30,327.9 | ksi | — | ||
| ↳ | 41,170.4 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.3510 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Exfoliation Energy(Eexf) | 88.02 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.3490 | - | — | ||
| ↳ | 0.4800 | - | — | ||
Shear Modulus(G)3 entries | 8,779.7 | ksi | — | ||
| ↳ | 15,916.3 | ksi | — | ||
| ↳ | 10,432.6 | ksi | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 0.3236 range 0.1676–1.468median of 18 measurements | BTU/(hr·ft·°F) | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1388 | lb/in³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.300 | eV | — | ||
| ↳ | 2.665 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 35.47 | - | — | ||
| ↳ | 1,026.1 | - | — | ||
| ↳ | 287.3 range 7.773–566.9median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.05735 | C/m² | — | ||
| ↳ | 0.000 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -33.12 | µV/K | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.1004 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.261 | eV/atom | — | ||
| ↳ | -3.163 | eV/atom | — |