TiO2
semiconductor· TiO2
Titanium dioxide (TiO₂) is a wide-bandgap semiconductor ceramic widely used as a photocatalyst, pigment, and functional coating material. It is the dominant choice for UV-protective and self-cleaning applications due to its strong photocatalytic activity under UV and visible light, excellent chemical stability, and non-toxicity. Engineers select TiO₂ over alternatives when photocatalytic degradation of pollutants, UV absorption, or self-sterilizing surfaces are required; it is also favored in applications demanding high refractive index and whiteness with minimal environmental concern.
photocatalytic coatings and water treatmentUV protective pigments and sunscreensself-cleaning surfaces and antimicrobial coatingsoptical and white pigmentsdye-sensitized solar cellsceramic and composite reinforcement
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 26,125.2 | ksi | — | ||
| ↳ | 30,327.9 | ksi | — | ||
| ↳ | 41,170.4 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.3510 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Exfoliation Energy(Eexf) | 88.02 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.3490 | - | — | ||
| ↳ | 0.4800 | - | — | ||
Shear Modulus(G)3 entries | 8,779.7 | ksi | — | ||
| ↳ | 15,916.3 | ksi | — | ||
| ↳ | 10,432.6 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 0.3236 range 0.1676–1.468median of 18 measurements | BTU/(hr·ft·°F) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1388 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.300 | eV | — | ||
| ↳ | 2.665 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 35.47 | - | — | ||
| ↳ | 1,026.1 | - | — | ||
| ↳ | 287.3 range 7.773–566.9median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.05735 | C/m² | — | ||
| ↳ | 0.000 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -33.12 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.1004 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.261 | eV/atom | — | ||
| ↳ | -3.163 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.