TeO2

semiconductor
· TeO2

Tellurium dioxide (TeO₂) is a heavy metal oxide semiconductor with a layered crystal structure, notable for its wide bandgap and strong optical properties including high refractive index and nonlinear optical response. It is primarily used in infrared optics, acousto-optic modulators, and integrated photonic devices, where its transparency in the infrared region and electro-optic capabilities make it valuable for wavelength conversion and optical signal processing. TeO₂ is also of significant research interest as a precursor material for layered semiconductor heterostructures and as a platform for exploring 2D material properties, positioning it as an emerging material for next-generation photonics and quantum optoelectronics applications.

infrared optics and windowsacousto-optic modulatorsnonlinear optical devicesintegrated photonicslaser frequency conversion2D material research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
Units:
siimperial
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
22.55
GPa—
↳
23.28
GPa—
↳
120.2
GPa—
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa—
Elastic Anisotropy(AU)
1.931
-—
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
Pa—
Exfoliation Energy(Eexf)
90.86
meV/atom—
Poisson's Ratio(ν)2 entries
0.2000
-—
↳
0.2000
-—
Shear Modulus(G)3 entries
16.94
GPa—
↳
17.07
GPa—
↳
45.71
GPa—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
7.076
kg/m³—
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
3.000
eV—
↳
1.562
eV—
Dielectric Constant (Relative Permittivity)(εr)2 entries
28.87
-—
↳
12.13
range 5.724–18.53median of 2 measurements
-—
Magnetic Moment(μB)
0.000
µB—
Piezoelectric Modulus(eij)2 entries
0.03194
C/m²—
↳
0.000
C/m²—
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²—
Seebeck Coefficient(S)
-118.6
µV/K—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.5192
eV/atom—
Formation Energy(ΔHf)2 entries
-1.093
eV/atom—
↳
-0.5988
eV/atom—
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.