Tellurium dioxide (TeO₂) is a heavy metal oxide semiconductor with a layered crystal structure, notable for its wide bandgap and strong optical properties including high refractive index and nonlinear optical response. It is primarily used in infrared optics, acousto-optic modulators, and integrated photonic devices, where its transparency in the infrared region and electro-optic capabilities make it valuable for wavelength conversion and optical signal processing. TeO₂ is also of significant research interest as a precursor material for layered semiconductor heterostructures and as a platform for exploring 2D material properties, positioning it as an emerging material for next-generation photonics and quantum optoelectronics applications.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 22.55 | GPa | — | ||
| ↳ | 23.28 | GPa | — | ||
| ↳ | 120.2 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 1.931 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Exfoliation Energy(Eexf) | 90.86 | meV/atom | — | ||
Poisson's Ratio(ν)2 entries | 0.2000 | - | — | ||
| ↳ | 0.2000 | - | — | ||
Shear Modulus(G)3 entries | 16.94 | GPa | — | ||
| ↳ | 17.07 | GPa | — | ||
| ↳ | 45.71 | GPa | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 7.076 | kg/m³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.000 | eV | — | ||
| ↳ | 1.562 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)2 entries | 28.87 | - | — | ||
| ↳ | 12.13 range 5.724–18.53median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.03194 | C/m² | — | ||
| ↳ | 0.000 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -118.6 | µV/K | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.5192 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -1.093 | eV/atom | — | ||
| ↳ | -0.5988 | eV/atom | — |