Te2I is a layered ceramic compound composed of tellurium and iodine, belonging to the family of chalcohalide semiconductors. This material is primarily of research interest for optoelectronic and photovoltaic applications, where its layered crystal structure and moderate mechanical properties make it a candidate for next-generation semiconductor devices. Te2I represents an emerging class of van der Waals materials that can potentially be exfoliated into thin films, making it relevant to researchers developing flexible electronics, photodetectors, and thin-film solar cells, though it remains largely in the laboratory development stage rather than widespread industrial production.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 2,865.9 | ksi | DFT · OptB88vdW | ||
Exfoliation Energy(Eexf) | 106.9 | meV/atom | DFT · OptB88vdW | ||
Poisson's Ratio(ν) | 0.2800 | - | DFT · OptB88vdW | ||
Shear Modulus(G) | 1,605.6 | ksi | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2033 | lb/in³ | DFT · OptB88vdW |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 0.2130 | eV | DFT · OptB88vdW | ||
| ↳ | 0.6370 | eV | DFT · TBmBJ | ||
Dielectric Constant (Relative Permittivity)(εr) | 86.13 | - | DFT · OptB88vdW | ||
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries | 21.94 | - | DFT · OptB88vdW | ||
| ↳ | 15.74 | - | DFT · TBmBJ | ||
Electron Effective Mass(m*e) | 0.00667 | me | DFT · OptB88vdW · 27°C | ||
Hole Effective Mass(m*h) | 0.00667 | me | DFT · OptB88vdW · 27°C | ||
Magnetic Moment(μB) | 0.000 | µB | DFT · OptB88vdW | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | DFT · OptB88vdW | ||
Thermoelectric Power Factor(PF)2 entries | 0.00135 | W/(m·K²) | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 0.00128 | W/(m·K²) | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Seebeck Coefficient(S)2 entries | -173.9 | μV/K | DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C | ||
| ↳ | 178.6 | μV/K | DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C | ||
Spectroscopic Limited Maximum Efficiency (SLME)(SLME) | 20.93 | % | DFT · TBmBJ |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | DFT · OptB88vdW | ||
Formation Energy(ΔHf) | -0.05148 | eV/atom | DFT · OptB88vdW |
Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data