TaI2O — Properties & Data | MatWorld

TaI2O

ceramic

· JVASP-4035· TaI2O

TaI₂O is an experimental mixed-metal oxide ceramic containing tantalum and iodine, representing an emerging compound in the layered oxide materials family. This material is primarily of research interest rather than established industrial use, with potential applications in advanced electronics, photocatalysis, or two-dimensional material platforms due to its layered crystal structure. Engineers would consider this material for next-generation device applications where tailored electronic, optical, or catalytic properties from rare-metal ceramics are required, though it remains in early-stage development compared to conventional tantalum oxides.

experimental electronic materialsphotocatalytic applicationslayered oxide researchhigh-temperature ceramics developmentthin-film device platforms

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Exfoliation Energy(Eexf)	66.31	meV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.2472	lb/in³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)	0.8720	eV	DFT · OptB88vdW
Dielectric Constant (Relative Permittivity)(εr)	36.76	-	DFT · OptB88vdW
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	0.000	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.000930	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00130	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-198.7	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	343.9	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.000	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-1.398	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

TaI2O

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental