Tantalum pentoxide (Ta₂O₅) is a high-refractive-index ceramic oxide with excellent chemical stability and dielectric properties, commonly encountered as a thin-film material rather than a bulk ceramic. It is widely used in optics, microelectronics, and integrated photonics where its high refractive index and transparency across visible-to-near-infrared wavelengths enable miniaturized optical coatings, waveguides, and photonic integrated circuits. Engineers select Ta₂O₅ over alternative oxides when superior optical performance, thermal stability, and compatibility with semiconductor processing are required, though its density and processing complexity make it less suitable for structural applications.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 18,320.9 | ksi | — | ||
| ↳ | 18,716.7 | ksi | — | ||
| ↳ | 32,690.1 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.9280 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Poisson's Ratio(ν)2 entries | 0.2640 | - | — | ||
| ↳ | 0.3500 | - | — | ||
Shear Modulus(G)3 entries | 10,242.4 | ksi | — | ||
| ↳ | 10,324.3 | ksi | — | ||
| ↳ | 15,192.7 | ksi | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2900 | lb/in³ | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 4.200 | eV | — | ||
| ↳ | 3.104 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 37.93 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.7858 | C/m² | — | ||
Seebeck Coefficient(S) | -352.9 | µV/K | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.06940 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.030 | eV/atom | — | ||
| ↳ | -2.974 | eV/atom | — |