Ta2O5
ceramic· Ta2O5
Tantalum pentoxide (Ta₂O₅) is a high-refractive-index ceramic oxide with excellent chemical stability and dielectric properties, commonly encountered as a thin-film material rather than a bulk ceramic. It is widely used in optics, microelectronics, and integrated photonics where its high refractive index and transparency across visible-to-near-infrared wavelengths enable miniaturized optical coatings, waveguides, and photonic integrated circuits. Engineers select Ta₂O₅ over alternative oxides when superior optical performance, thermal stability, and compatibility with semiconductor processing are required, though its density and processing complexity make it less suitable for structural applications.
optical thin films and coatingsintegrated photonics and waveguidesmicroelectronic capacitors and dielectricsinfrared opticsanti-reflective coatingsphotonic devices
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 18,320.9 | ksi | — | ||
| ↳ | 18,716.7 | ksi | — | ||
| ↳ | 32,690.1 | ksi | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.9280 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | ksi | — | ||
Poisson's Ratio(ν)2 entries | 0.2640 | - | — | ||
| ↳ | 0.3500 | - | — | ||
Shear Modulus(G)3 entries | 10,242.4 | ksi | — | ||
| ↳ | 10,324.3 | ksi | — | ||
| ↳ | 15,192.7 | ksi | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.2900 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 4.200 | eV | — | ||
| ↳ | 3.104 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr) | 37.93 | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.7858 | C/m² | — | ||
Seebeck Coefficient(S) | -352.9 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.06940 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.030 | eV/atom | — | ||
| ↳ | -2.974 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.