Ta2O5

ceramic
· Ta2O5

Tantalum pentoxide (Ta₂O₅) is a high-refractive-index ceramic oxide with excellent chemical stability and dielectric properties, commonly encountered as a thin-film material rather than a bulk ceramic. It is widely used in optics, microelectronics, and integrated photonics where its high refractive index and transparency across visible-to-near-infrared wavelengths enable miniaturized optical coatings, waveguides, and photonic integrated circuits. Engineers select Ta₂O₅ over alternative oxides when superior optical performance, thermal stability, and compatibility with semiconductor processing are required, though its density and processing complexity make it less suitable for structural applications.

optical thin films and coatingsintegrated photonics and waveguidesmicroelectronic capacitors and dielectricsinfrared opticsanti-reflective coatingsphotonic devices

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)3 entries
126.3
GPa
129.0
GPa
225.4
GPa
Elastic Compliance Tensor(Sij)
Matrix (redacted)
1/GPa
Elastic Anisotropy(AU)
0.9280
-
Elastic Stiffness Tensor(Cij)
Matrix (redacted)
Pa
Poisson's Ratio(ν)2 entries
0.2640
-
0.3500
-
Shear Modulus(G)3 entries
70.62
GPa
71.18
GPa
104.8
GPa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
8.028
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
4.200
eV
3.104
eV
Dielectric Constant (Relative Permittivity)(εr)
37.93
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)
0.7858
C/m²
Seebeck Coefficient(S)
-352.9
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.06940
eV/atom
Formation Energy(ΔHf)2 entries
-3.030
eV/atom
-2.974
eV/atom
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.