SiSn — Properties & Data | MatWorld

SiSn

Name: SiSn
Brand: MatWorld

semiconductor

· SiSn

SiSn is a silicon-tin compound semiconductor material that combines the two group IV elements to create a tunable bandgap material. While not yet commercialized at production scale, SiSn is actively researched as a potential next-generation semiconductor for optoelectronic and photonic applications, offering the possibility of direct bandgap engineering and monolithic integration with existing silicon infrastructure—advantages over conventional indirect-bandgap silicon.

infrared optoelectronicsphotonic integrated circuitsmid-infrared detectorssilicon photonics integrationthin-film research applicationsbandgap engineering research

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions	Source
Density(ρ)	4.347	kg/m³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

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Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)2 entries	0.2480	eV	DFT · OptB88vdW
↳	0.5900	eV	Measured
Dielectric Constant (Relative Permittivity)(εr)2 entries	28.76	-	DFT · OptB88vdW
↳	24.66 range 24.53–24.80median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)	22.04	-	DFT · OptB88vdW
Electron Effective Mass(m*e)	0.02000	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.03000	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	0.2446	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00401	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00366	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-142.8	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	188.1	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.1596	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	0.1572	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

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RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

SiSn

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