SiO2

ceramic

· SiO2

Silicon dioxide (SiO₂) is an inorganic ceramic compound that exists in both crystalline forms (quartz, cristobalite) and amorphous forms (silica glass). It is one of the most abundant and versatile ceramic materials, used across industries ranging from construction and electronics to optics and chemical processing. Engineers select SiO₂ for applications requiring chemical inertness, thermal stability, optical transparency, or dielectric properties, and it serves as a foundational material for advanced composites, coatings, and refractories where cost-effectiveness and processability are critical alongside moderate mechanical demands.

optical windows and lensessemiconductor device insulatorsrefractory liningsglass fibers and compositesthermal insulationchemical laboratory equipment

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

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Method

Property	Value	Unit	Conditions	Source
Bulk Modulus(K)3 entries	1,866.9	ksi	DFT
↳	14,274.6	ksi	DFT · OptB88vdW
↳	3,761.3	ksi	DFT · PBE
Elastic Compliance Tensor(Sij)	Matrix (redacted)	1/GPa	DFT · PBE
Elastic Anisotropy(AU)	0.9860	-	DFT · PBE
Elastic Stiffness Tensor(Cij)	Matrix (redacted)	ksi	DFT · PBE
Poisson's Ratio(ν)2 entries	0.1600	-	DFT · OptB88vdW
↳	0.06000	-	DFT · PBE
Shear Modulus(G)3 entries	6,240.4	ksi	DFT
↳	11,952.6	ksi	DFT · OptB88vdW
↳	4,688.2	ksi	DFT · PBE

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Thermal Conductivity(k)	0.9245	BTU/(hr·ft·°F)	Measured

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.07724	lb/in³	DFT · OptB88vdW

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Method

Carrier

Property	Value	Unit	Conditions	Source
Band Gap(Eg)2 entries	5.985	eV	DFT · OptB88vdW
↳	8.097	eV	DFT · TBmBJ
Dielectric Constant (Relative Permittivity)(εr)3 entries	4.208	-	DFT · OptB88vdW
↳	3.890 range 3.740–4.040median of 2 measurements	-	DFT · PBE
↳	3.052 range 2.211–3.894median of 2 measurements	-	DFT · PBEsol
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	2.534	-	DFT · OptB88vdW
↳	2.122	-	DFT · TBmBJ
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)2 entries	0.2604	C/m²	DFT · OptB88vdW
↳	0.04423	C/m²	DFT · PBE
Piezoelectric Stress Tensor(eij)	Matrix (redacted)	C/m²	DFT · PBE
Thermoelectric Power Factor(PF)2 entries	0.000915	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000863	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-136.4	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	457.8	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	0.000	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Method

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.03120	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)2 entries	-2.870	eV/atom	DFT · OptB88vdW
↳	-3.138	eV/atom	Measured

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

SiO2 — Properties & Data | MatWorld