SiO2
ceramic· SiO2
Silicon dioxide (SiO₂) is an inorganic ceramic compound that exists in both crystalline forms (quartz, cristobalite) and amorphous forms (silica glass). It is one of the most abundant and versatile ceramic materials, used across industries ranging from construction and electronics to optics and chemical processing. Engineers select SiO₂ for applications requiring chemical inertness, thermal stability, optical transparency, or dielectric properties, and it serves as a foundational material for advanced composites, coatings, and refractories where cost-effectiveness and processability are critical alongside moderate mechanical demands.
optical windows and lensessemiconductor device insulatorsrefractory liningsglass fibers and compositesthermal insulationchemical laboratory equipment
Compliance & Regulations
?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K)3 entries | 25.93 | GPa | — | ||
| ↳ | 12.87 | GPa | — | ||
| ↳ | 98.42 | GPa | — | ||
Elastic Compliance Tensor(Sij) | Matrix (redacted) | 1/GPa | — | ||
Elastic Anisotropy(AU) | 0.9860 | - | — | ||
Elastic Stiffness Tensor(Cij) | Matrix (redacted) | Pa | — | ||
Poisson's Ratio(ν)2 entries | 0.06000 | - | — | ||
| ↳ | 0.1600 | - | — | ||
Shear Modulus(G)3 entries | 32.32 | GPa | — | ||
| ↳ | 43.03 | GPa | — | ||
| ↳ | 82.41 | GPa | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Thermal Conductivity(k) | 1.600 | W/(m·K) | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 2.138 | kg/m³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | 5.621 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 4.208 | - | — | ||
| ↳ | 3.052 range 2.211–3.894median of 2 measurements | - | — | ||
| ↳ | 3.890 range 3.740–4.040median of 2 measurements | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij)2 entries | 0.04423 | C/m² | — | ||
| ↳ | 0.2604 | C/m² | — | ||
Piezoelectric Stress Tensor(eij) | Matrix (redacted) | C/m² | — | ||
Seebeck Coefficient(S) | -153.8 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.03120 | eV/atom | — | ||
Formation Energy(ΔHf)2 entries | -3.138 | eV/atom | — | ||
| ↳ | -2.870 | eV/atom | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.