SiHfO3
semiconductorSiHfO3 is a hafnium silicate ceramic compound that combines silicon and hafnium oxides, belonging to the class of advanced refractory and dielectric materials. This material is primarily of research and developmental interest for high-temperature applications and next-generation semiconductor gate dielectrics, where it offers potential improvements in thermal stability and dielectric performance compared to conventional oxides. Its notable appeal lies in its high melting point and chemical inertness, making it a candidate for extreme-environment electronics and thermal barrier coating systems, though industrial adoption remains limited and its properties continue to be characterized in academic and industrial research settings.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | — | eV | — | — | |
| ↳ | — | eV | — | — | |
Magnetic Moment(μB)2 entries | — | μB | — | — | |
| ↳ | — | μB | — | — |
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Formation Energy(ΔHf)2 entries | — | eV/atom | — | — | |
| ↳ | — | eV/atom | — | — |