SiH4 — Properties & Data | MatWorld

SiH4

ceramic

· SiH4

Silane (SiH4) is a gaseous silicon hydride compound that serves primarily as a precursor material rather than a final-form engineering material. In materials processing, silane is a critical feedstock for chemical vapor deposition (CVD) and plasma-enhanced CVD (PECVD) to synthesize silicon-based ceramics, thin films, and coatings. Engineers select silane for semiconductor manufacturing, photovoltaic device fabrication, and protective coating deposition because it enables precise control over film composition and microstructure at relatively low processing temperatures compared to solid silicon sources.

semiconductor thin film depositionphotovoltaic manufacturingsilicon carbide/nitride coatingsCVD precursoroptical coatingsmicroelectronics fabrication

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	699.1	ksi	DFT · OptB88vdW
Exfoliation Energy(Eexf)	39.65	meV/atom	DFT · OptB88vdW
Poisson's Ratio(ν)	0.2700	-	DFT · OptB88vdW
Shear Modulus(G)	416.3	ksi	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.03031	lb/in³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Method

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)3 entries	6.144	eV	DFT · OptB88vdW
↳	7.790	eV	DFT · TBmBJ
↳	7.400	eV	DFT · HSE06
Dielectric Constant (Relative Permittivity)(εr)2 entries	2.797	-	DFT · OptB88vdW
↳	2.470	-	DFT · PBE
High-Frequency Dielectric Constant (ε∞)(ε∞)2 entries	2.658	-	DFT · OptB88vdW
↳	2.110	-	DFT · TBmBJ
Electronic Dielectric Tensor(ε∞)	Matrix (redacted)	-	DFT · PBE
Total Dielectric Tensor(ε)	Matrix (redacted)	-	DFT · PBE
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Piezoelectric Modulus(eij)	0.000	C/m²	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.00130	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.000890	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-206.9	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	375.6	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Spectroscopic Limited Maximum Efficiency (SLME)(SLME)	0.000	%	DFT · TBmBJ

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.00120	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.000830	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

SiH4

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental