Si2Os — Properties & Data | MatWorld

Si2Os

ceramic

· JVASP-93666· Si2Os

Si₂O₅ is a silica-based ceramic compound belonging to the silicate family, characterized by a specific silicon-to-oxygen ratio that positions it between common silica (SiO₂) and more complex silicate structures. This material exhibits high stiffness and density, making it suitable for load-bearing and high-temperature applications where structural integrity is critical. It is used in specialized refractory systems, advanced ceramics for thermal management, and potentially in optical or electronic ceramic applications where the particular stoichiometry offers advantages over pure silica or conventional silicates.

refractory ceramicsthermal barrier coatingshigh-temperature structural componentsadvanced optical ceramicselectronic substrate materialswear-resistant components

Compliance & Regulations

?Conflict Free?RoHS?REACH?TSCA?Prop 65

Units:

si imperial

Property	Value	Unit	Conditions
Bulk Modulus(K)	28,473.8	ksi	DFT · OptB88vdW
Poisson's Ratio(ν)	0.2300	-	DFT · OptB88vdW
Shear Modulus(G)	18,821.5	ksi	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Property	Value	Unit	Conditions	Source
Density(ρ)	0.3367	lb/in³	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Filter by

Carrier

Property	Value	Unit	Conditions
Band Gap(Eg)	0.5140	eV	DFT · OptB88vdW
High-Frequency Dielectric Constant (ε∞)(ε∞)	18.21	-	DFT · OptB88vdW
Electron Effective Mass(m*e)	0.4500	me	DFT · OptB88vdW · 27°C
Hole Effective Mass(m*h)	0.6667	me	DFT · OptB88vdW · 27°C
Magnetic Moment(μB)	0.000	µB	DFT · OptB88vdW
Thermoelectric Power Factor(PF)2 entries	0.000713	W/(m·K²)	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	0.00146	W/(m·K²)	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C
Seebeck Coefficient(S)2 entries	-111.9	μV/K	DFT · OptB88vdW · n-type · 1e20 cm⁻³ · 327°C
↳	202.4	μV/K	DFT · OptB88vdW · p-type · 1e20 cm⁻³ · 327°C

N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form, heat treatment, basis, or test environment.

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Property	Value	Unit	Conditions	Source
Energy Above Hull(ΔEhull)	0.01460	eV/atom	DFT · OptB88vdW
Formation Energy(ΔHf)	-0.3190	eV/atom	DFT · OptB88vdW

Verified Unverified Low confidence (<80%) Link to source

Reference data from cited sources. Not verified or certified by MatWorld Inc. Verify against the source before use in design. Terms: engineering data

Regulatory Screening

Environmental

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.

Si2Os

Mechanical Properties

Physical Properties

Electrical Properties

Other Properties

Regulatory Screening

Environmental