Si0.3Ge0.7
semiconductorSi₀.₃Ge₀.₇ is a silicon-germanium alloy semiconductor with a germanium-rich composition, engineered for optoelectronic and high-speed electronic applications where bandgap and lattice properties intermediate between pure Si and Ge are advantageous. This material is used in infrared detectors, photodiodes, and heterojunction bipolar transistors (HBTs) in telecommunications and imaging systems, where its narrow bandgap enables detection of longer wavelengths and higher carrier mobility compared to pure silicon. The specific Ge fraction (70%) makes it particularly suited for mid-wave infrared sensing and can be lattice-matched to Ge substrates, reducing defect density in epitaxial growth compared to lattice-mismatched alternatives.
Compliance & Regulations
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg) | — | eV | — | — |