ScNiSb

semiconductor
· ScNiSb

ScNiSb is a ternary intermetallic compound combining scandium, nickel, and antimony, belonging to the Heusler or half-Heusler alloy family of semiconductors. This material is primarily of research interest for thermoelectric and spintronic applications, where its electronic band structure and thermal transport properties make it a candidate for solid-state energy conversion and potential magnetoresistive devices. The compound represents an emerging materials system where engineers and materials scientists explore unconventional elemental combinations to achieve improved figure-of-merit values or novel functional properties beyond what conventional binary or ternary semiconductors provide.

thermoelectric devicesresearch semiconductorsspintronicssolid-state energy conversionhigh-temperature power generationmaterials exploration

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
103.6
GPa
105.3
GPa
Poisson's Ratio(ν)
0.2500
-
Shear Modulus(G)2 entries
66.34
GPa
64.02
GPa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
6.573
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
0.1100
eV
0.2630
eV
Dielectric Constant (Relative Permittivity)(εr)3 entries
22.40
-
22.65
-
20.04
range 18.08–22.00median of 2 measurements
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)2 entries
0.07435
C/m²
0.08595
C/m²
Piezoelectric Stress Tensor(eij)
Matrix (redacted)
C/m²
Seebeck Coefficient(S)
-280.7
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.000
eV/atom
Formation Energy(ΔHf)
-0.9229
eV/atom
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.