ScAgO2
semiconductor· ScAgO2
ScAgO2 is a mixed-metal oxide semiconductor composed of scandium, silver, and oxygen, representing an emerging compound in the functional ceramics research space. While not yet established in mainstream industrial production, materials in this chemical family are investigated for applications requiring combined electrical conductivity and mechanical stability, particularly in contexts where silver's conductive properties and scandium's strengthening effects offer advantages over conventional semiconductors. Its development reflects ongoing research into high-performance oxide semiconductors for next-generation electronic and optoelectronic devices.
experimental semiconductor researchoxide electronicsconductive ceramic developmentadvanced functional materialshigh-temperature electronic applications
Compliance & Regulations
?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Bulk Modulus(K) | 19,800.6 | ksi | — | ||
Poisson's Ratio(ν) | 0.3700 | - | — | ||
Shear Modulus(G) | 7,769.7 | ksi | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Density(ρ) | 0.1986 | lb/in³ | — |
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Band Gap(Eg)2 entries | 3.800 | eV | — | ||
| ↳ | 2.294 | eV | — | ||
Dielectric Constant (Relative Permittivity)(εr)3 entries | 13.81 | - | — | ||
| ↳ | 15.04 | - | — | ||
| ↳ | 9.684 range 6.081–13.29median of 2 measurements | - | — | ||
Electronic Dielectric Tensor(ε∞) | Matrix (redacted) | - | — | ||
Total Dielectric Tensor(ε) | Matrix (redacted) | - | — | ||
Magnetic Moment(μB) | 0.000 | µB | — | ||
Piezoelectric Modulus(eij) | 0.000 | C/m² | — | ||
Seebeck Coefficient(S) | -159.4 | µV/K | — |
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
| Property | Value | Unit | Conditions | Source | |
|---|---|---|---|---|---|
Energy Above Hull(ΔEhull) | 0.000 | eV/atom | — | ||
Formation Energy(ΔHf) | -2.479 | eV/atom | — |
Verified Unverified Low confidence (<80%) Link to source
Regulatory Screening
Environmental
Export Control
RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.