PdSe2

semiconductor
· PdSe2

PdSe2 is a layered transition metal dichalcogenide (TMD) semiconductor composed of palladium and selenium, belonging to the family of two-dimensional materials with a van der Waals structure. Currently in the research and development phase rather than established industrial production, PdSe2 is being investigated for next-generation electronic and optoelectronic devices due to its semiconducting properties, tunable bandgap, and potential for integration into flexible or atomically-thin device architectures. Engineers and researchers are exploring this material as an alternative to conventional semiconductors for applications requiring high carrier mobility, layer-dependent electronic behavior, or integration into heterostructure devices where traditional bulk materials are impractical.

2D material researchthin-film transistorsphotodetectorsflexible electronicsheterostructure devicesnext-generation semiconductors

Compliance & Regulations

?EAR?Conflict Free?RoHS?REACH?TSCA?Prop 65
PropertyValueUnitConditionsSource
Bulk Modulus(K)2 entries
22.53
GPa
58.37
GPa
Exfoliation Energy(Eexf)
166.2
meV/atom
Poisson's Ratio(ν)
0.2900
-
Shear Modulus(G)2 entries
14.48
GPa
27.94
GPa
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Density(ρ)
6.627
kg/m³
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Band Gap(Eg)2 entries
0.4000
eV
0.000
eV
Dielectric Constant (Relative Permittivity)(εr)2 entries
14.40
-
28.85
-
Electronic Dielectric Tensor(ε∞)
Matrix (redacted)
-
Total Dielectric Tensor(ε)
Matrix (redacted)
-
Magnetic Moment(μB)
0.000
µB
Piezoelectric Modulus(eij)
0.000
C/m²
Seebeck Coefficient(S)
-37.11
µV/K
N entriesMultiple entries per property — large groups are collapsed; click a summary row to expand. Use filters above to narrow by form / heat treatment / basis.
Verified Unverified Low confidence (<80%) Link to source
PropertyValueUnitConditionsSource
Energy Above Hull(ΔEhull)
0.04520
eV/atom
Formation Energy(ΔHf)
-0.2585
eV/atom
Verified Unverified Low confidence (<80%) Link to source

Regulatory Screening

Environmental

Export Control

RoHS, REACH, and Prop 65 statuses are validated against official substance lists (ECHA SVHC Candidate List, OEHHA Prop 65, RoHS Annex II). Other regulations are estimated from composition and material classification. All screening is a starting point for due diligence — always verify with your supplier before making compliance decisions.